Constance - SCANNING ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE

Features:

* High resolution,better image quality

* Flip open hairpin tungsten cathode,easy to replace filament

* Chinese and English operation menu with one-click image view function

* Automatic function: electron gun heating, biasing, alignment, focus, brightness, contrast, astigmation

* Auto calibration and malfunction detection

* Low maintenance cost

Technical Parameters:

Model		BK-EM6200
Resolution		4.5nm (30KV)
Magnification		15x-250,000x
Electron Gun Type		Flip open hairpin tungsten cathode
Accelerating Voltage		0~30KV
Lens System		Three stage electromagnetic lens(Conical lens)
Objective Lens Aperture		Three selectable
Specimen Stage		Manual, X/Y automatic(optional)
Travel Range	X	0~50mm
	Y	0~50mm
	Z	0~25mm
	R	0~360
	T	-5~90
Detector		SE detector, BSE detector(optional), X-ray EDS(optional), EBS(optional)
Vacuum System		Turbo molecular pump, diffusion pump(optional)
Wooden Package Size		Host packing: 106010601900mm Electric appliance cabinet: 162014601750mm
Gross Weight		550kg

SCANNING ELECTRON MICROSCOPE